A high-temperature Auger electron spectrometer setup and its application to reactive wetting experiments at 1700 K

被引:0
作者
L. D. Alphei
C. Dobbe
V. Becker
J. A. Becker
机构
[1] Gottfried Wilhelm Leibniz Universität Hannover,Institut für Physikalische Chemie und Elektrochemie
来源
Journal of Materials Science | 2015年 / 50卷
关键词
Contact Angle; Auger Electron Spectroscopy; Molten Silicon; Reactive Wetting; Primary Electron Beam;
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学科分类号
摘要
A high-temperature Auger electron spectroscopy setup and its in situ application to sessile drop experiments of molten silicon on oxide substrates are presented. The experimental setup allows for measurements of previously inaccessible surface reactions at temperatures up to 1700 K. Auger electron spectra of SiO2, MgO, and liquid Si are presented. Furthermore, the areas of the substrates that have been transiently wetted by the silicon melt are investigated. The results are discussed with respect to questions concerning reactive wetting of oxides by metal melts, which are important for the material science of joining processes.
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页码:3175 / 3182
页数:7
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