Determination of dislocation densities in HCP metals from X-ray diffraction line-broadening analysis

被引:25
作者
Griffiths M. [1 ]
Sage D. [1 ]
Holt R.A. [1 ]
Tome C.N. [2 ]
机构
[1] Atomic Energy of Canada Ltd., Chalk River, ON
[2] Los Alamos National Laboratory, Los Alamos, NM 87545
关键词
Material Transaction; Dislocation Density; Basal Plane; Burger Vector; Dislocation Structure;
D O I
10.1007/s11661-002-0155-9
中图分类号
学科分类号
摘要
X-Ray diffraction (XRD) line-broadening analysis has been performed on highly textured Zr-2.5Nb specimens which had been deformed in tensile tests to produce well-controlled dislocation structures. An iterative deconvolution method has been applied to extract the broadening function for the material, using as standards, a Zr single crystal and a 0 pct deformed specimen. In both cases, for specific tensile tests, a significant contribution to the basal line broadening was observed, which was clearly not directly related to the dislocation structure generated by the deformation, i.e., so-called c-component dislocations having a component of their Burgers vectors perpendicular to the basal plane. Calculations showed that the extent of basal line broadening cannot be attributed to the secondary effect of strain from a-type dislocations, i.e., dislocations with Burgers vectors parallel with the basal plane. It is concluded that most of the line broadening observed was the result of intergranular strain distributions. These distributions are most prominent for grains oriented with their c-axes perpendicular to the tensile-deformation axis and resulted in basal-plane line broadening even when there were few, if any, c-component dislocations present.
引用
收藏
页码:859 / 865
页数:6
相关论文
共 22 条
[1]  
Warren B.E., Averbach B.L., J. Appl. Phys., 21, (1950)
[2]  
Williamson G.K., Smallman R.E., Phil. Mag., 1, (1956)
[3]  
Krivoglaz M.A., Ryaboshapka K.P., Fiz. Metall., 15, 1, (1963)
[4]  
Wilkens M., Phys. Status Solidi (a), 2, (1970)
[5]  
Wilkens M., Proc. 5th Riso Int. Symp. on Metallurgy and Materials Science, (1984)
[6]  
Aqua E.N., Owens C.M., Trans. TMS-AIME, 239, (1967)
[7]  
Griffiths M., Winegar J.E., Mecke J.F., Holt R.A., Adv. X-ray Analysis, 35, (1992)
[8]  
Warren B.E., X-ray Diffraction, (1969)
[9]  
Klimanek P., Kuzel R., J. Appl. Cryst., 21, (1988)
[10]  
Kuzel R., Klimanek P., J. Appl. Cryst., 21, (1988)