A zoom into the nanoscale texture of secondary cell walls

被引：0
作者：
Tobias Keplinger
Johannes Konnerth
Véronique Aguié-Béghin
Markus Rüggeberg
Notburga Gierlinger
Ingo Burgert
机构：
[1] Institute for Building Materials,Department of Materials Science and Process Engineering
[2] ETH Zurich,undefined
[3] Applied Wood Research Laboratory,undefined
[4] Empa - Swiss Federal Laboratories for Material Testing and Research,undefined
[5] BOKU-University of Natural Resources and Life Science,undefined
[6] INRA-UMR-614 Fractionnement des Agro-Ressources et Environnement (FARE),undefined
[7] Université de Reims Champagne-Ardenne,undefined
[8] UMR614 Fractionnement des Agro-Ressources et Environnement (FARE),undefined
来源：
Plant Methods | / 10卷
关键词：
Secondary cell walls; Scanning near field optical microscopy; Atomic force microscopy; Diffraction limit; Lignification;
D O I：
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学科分类号：
摘要：
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