The Wannier-Stark effects in the 6H-SiC planar junction field-effect transistors with a p-n junction as the gate

被引:0
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作者
V. I. Sankin
P. P. Shkrebiĭ
A. A. Lebedev
机构
[1] Russian Academy of Sciences,Ioffe Physicotechnical Institute
来源
Semiconductors | 2006年 / 40卷
关键词
85.30.Tv; 71.70.Ej; 73.40.Lq;
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学科分类号
摘要
Dependence of the short-circuit photocurrent on the voltage Vg applied to the gate of the 6H-SiC planar field-effect transistor is studied. The negative differential photoconductivity appeared at a certain value of Vg; the parameters of this photoconductivity corresponded to those of the Wannier-Stark ladders in the natural 6H-SiC super lattice. At the same value of Vg, a fairly abrupt decrease to zero of the source-drain current Isd is observed, which is indicative of cutoff at the voltage that is much lower than the expected cutoff voltage for this structure. The effect is attributed to a decrease in mobility in the mode of the Wannier-Stark ladders, a decrease in the rate of ionization of the donor atoms, and a reduction in the screening of the field.
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页码:1237 / 1241
页数:4
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