Study of γ/γ′ Interfaces in Nickel-Based, Single-Crystal Superalloys by Scanning Transmission Electron Microscopy

被引：0
|
作者：
Binghui Ge
Yushi Luo
Jiarong Li
Jing Zhu
机构：
[1] Tsinghua University,Beijing National Center for Electron Microscopy
[2] Institute of Physics,National Key Laboratory of Science and Technology on Advanced High Temperature Structural Materials
[3] Chinese Academy of Sciences,Department of Materials Science and Engineering
[4] Beijing Institute of Aeronautical Materials,undefined
[5] Laboratory of Advanced Materials,undefined
[6] Beijing National Center for Electron Microscopy,undefined
[7] Tsinghua University,undefined
来源：
Metallurgical and Materials Transactions A | 2011年 / 42卷
关键词：
Heavy Atom; Heavy Element; Scanning Transmission Electron Microscopy; Growth Step; Creep Process;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The interfaces of γ/γ′ in crept Re-bearing, single-crystal, nickel-based superalloys have been studied by scanning transmission electron microscopy. Elements Ni and Ta are congregated at the γ′ side, ahead of the Re enrichment near interfaces, which shows the retarding effect on element diffusion during creep by Re enrichment. A growth step exists at the γ/γ′ interfaces with the apex of kinks congregated with heavy atoms, which may slow down interface displacement during creep.
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页码：548 / 552
页数：4
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