A mechanical model of the contact interaction between the atomic force microscope measuring element and a surface under investigation

被引:1
作者
Goldstein R.V. [1 ]
Gorodtsov V.A. [1 ]
Ustinov K.B. [1 ]
机构
[1] Institute for Problems in Mechanics, Russian Academy of Sciences, St. Petersburg
来源
Nanotechnologies in Russia | 2009年 / 4卷 / 7-8期
关键词
Atomic Force Microscope; Probe Contact; Atomic Force Microscope Probe; Atomic Force Microscope Cantilever; Probe Geometry;
D O I
10.1134/S1995078009070155
中图分类号
学科分类号
摘要
A hierarchic set of gradually complicated models is suggested. The models describe the contact condition of the mechanical interaction between the atomic force microscope (AFM) probe and the investigated surface while allowing for various factors. A variant of the AFM probe-surface mechanical interaction model is developed which takes into account the simultaneous effect of the probe geometry and the elastic deformations of the AFM cantilever that take place when there is a small or moderate curvature of surfaces under study. A variant of the model of interaction between the AFM probe and the surface of the investigated specimen is discussed, taking into consideration the simultaneous effect of the probe geometry and elastic deformations of the AFM cantilever and the probe contact with the surface under study within the framework of Derjaguin-Muller-Toropov model. Algorithms to determine the AFM probe position are created to optimize computations. © Pleiades Publishing, Ltd., 2009.
引用
收藏
页码:525 / 529
页数:4
相关论文
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