Measurement of thicknesses and optical properties of thin films from Surface Plasmon Resonance (SPR)

被引：0
|
作者：
Jérôme Salvi
Dominique Barchiesi
机构：
[1] UMR6174—Université de Franche-Comté,Franche
[2] University of Technology of Troyes (UTT)–Automatic Mesh Generation and Advanced Methods (GAMMA3),Comté Électronique Mécanique, Thermique et Optique–Sciences et Technologies (FEMTO
来源：
Applied Physics A | 2014年 / 115卷
关键词：
Inverse Problem; Particle Swarm Optimization; Surface Plasmon Resonance; Fitness Function; Relative Permittivity;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The inverse problem for thin film properties is a challenge for nanotechnology engineering. We propose the application of a simple and intuitive numerical scheme: a basic particle swarm optimization (PSO) method, to solve the inverse problem from surface plasmon resonance (SPR) experimental results. The purpose is to retrieve unknown parameters from the measurement of the fall in reflectivity due to the excitation of a surface plasmon polariton at a metal/dielectric interface. In this case, the PSO results reveal the possibility of fully exploring the measurement results of experimental angular exploration of the reflectivity by multilayers.
引用
收藏
页码：245 / 255
页数：10
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