Microwave Power Dependence of Surface Resistance of High-Temperature Superconductor YBa2Cu3Oy Films by Dielectric Resonator Method

被引：0
|
作者：
H. Obara
M. Murugesan
K. Develos-Bagarinao
Y. Mawatari
H. Yamasaki
S. Kosaka
机构：
[1] National Institute of Advanced Industrial Science and Technology (AIST),
来源：
Journal of Superconductivity and Novel Magnetism | 2006年 / 19卷
关键词：
superconductor; microwave; thin film; passive device; high power;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The microwave power dependence of the surface resistance of YBa2Cu3Oy films of two different surface morphologies was measured using the dielectric resonator method. The dielectric resonator consisted of a high-quality sapphire rod sandwiched between two superconductor films. Measurements showed that the microwave power dependence of the surface resistance strongly depended on the surface morphology of the YBa2Cu3Oy film though the surface resistance of those films at low microwave power was comparable. In conclusion, the surface morphology is one of the reasons of the power dependence which is crucial for high power applications.
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页码：657 / 660
页数：3
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