Optical Studies of Molecular-Beam Epitaxy-Grown Hg1−xCdxTe with x = 0.7–0.8

被引:0
|
作者
K. D. Mynbaev
A. M. Smirnov
N. L. Bazhenov
N. N. Mikhailov
V. G. Remesnik
M. V. Yakushev
机构
[1] Ioffe Institute,
[2] ITMO University,undefined
[3] A.V. Rzhanov Institute of Semiconductor Physics of SB RAS,undefined
来源
Journal of Electronic Materials | 2020年 / 49卷
关键词
HgCdTe; luminescence; defects; alloy disorder;
D O I
暂无
中图分类号
学科分类号
摘要
Optical transmission, photoluminescence and photoconductivity were used to study Hg1−xCdxTe with x = 0.7–0.8 (bandgap 0.8–1.1 eV at 300 K) grown by molecular-beam epitaxy. The studied material, which included layers used as spacers and barriers in potential- and quantum-well structures, showed a considerable degree of alloy disorder similar to narrower-bandgap HgCdTe grown by the same method. The observed disorder seemed to have no effect on the structural properties of the material and its optical absorption. Optimization of the growth technology of wider-bandgap HgCdTe should help improve the quality of potential- and quantum-well structures based on this material.
引用
收藏
页码:4642 / 4646
页数:4
相关论文
共 48 条
  • [11] Threading and misfit-dislocation motion in molecular-beam epitaxy-grown HgCdTe epilayers
    Carmody, M
    Lee, D
    Zandian, M
    Phillips, J
    Arias, J
    JOURNAL OF ELECTRONIC MATERIALS, 2003, 32 (07) : 710 - 716
  • [12] Optical properties of molecular beam epitaxy-grown HgCdTe structures with potential wells
    Ivanov-Omskii, V. I.
    Mynbaev, K. D.
    Bazhenov, N. L.
    Smirnov, V. A.
    Mikhailov, N. N.
    Sidorov, G. Yu.
    Remesnik, V. G.
    Varavin, V. S.
    Dvoretsky, S. A.
    PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7 NO 6, 2010, 7 (06): : 1621 - 1623
  • [13] Low-temperature activation of as in Hg1-xCdxTe(211) grown on Si by molecular beam epitaxy
    Boieriu, P
    Chen, Y
    Nathan, V
    JOURNAL OF ELECTRONIC MATERIALS, 2002, 31 (07) : 694 - 698
  • [14] Molecular-beam epitaxy-grown HgCdTe infrared detector: Material physics, structure design, and device fabrication
    Xiaohui Wang
    Mengbo Wang
    Yulong Liao
    Huaiwu Zhang
    Baohui Zhang
    Tianlong Wen
    Jiabao Yi
    Liang Qiao
    Science China Physics, Mechanics & Astronomy, 2023, 66
  • [15] Magnetoluminescence properties of Hg1-xCdxTe epitaxial layers and superlattice structures grown by metalorganic molecular beam epitaxy
    Tran, TK
    Parikh, A
    Pearson, SD
    Wagner, BK
    Benz, RG
    BicknellTassius, RN
    Summers, CJ
    Kelz, T
    Tomm, JW
    Hoerstel, W
    Schafer, P
    Muller, U
    JOURNAL OF ELECTRONIC MATERIALS, 1996, 25 (08) : 1203 - 1208
  • [16] Molecular-beam epitaxy-grown HgCdTe infrared detector: Material physics, structure design, and device fabrication
    Wang, Xiaohui
    Wang, Mengbo
    Liao, Yulong
    Zhang, Huaiwu
    Zhang, Baohui
    Wen, Tianlong
    Yi, Jiabao
    Qiao, Liang
    SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY, 2023, 66 (03)
  • [17] High-resolution X-ray diffraction studies of molecular beam epitaxy-grown HgCdTe heterostructures and CdZnTe substrates
    Sewell, RH
    Musca, CA
    Dell, JM
    Faraone, L
    Usher, BF
    Dieing, T
    JOURNAL OF ELECTRONIC MATERIALS, 2005, 34 (06) : 795 - 803
  • [18] The optical excitation mechanism in ZnS:Sm3+ grown by molecular-beam epitaxy
    Tanaka, Masanori
    Kurita, Atusi
    Yamada, Hisashi
    Akimoto, Katsuhiro
    SOLID STATE COMMUNICATIONS, 2007, 142 (1-2) : 36 - 40
  • [19] High-resolution X-ray diffraction studies of molecular beam epitaxy-grown HgCdTe heterostructures and CdZnTe substrates
    R. H. Sewell
    C. A. Musca
    J. M. Dell
    L. Faraone
    B. F. Usher
    T. Dieing
    Journal of Electronic Materials, 2005, 34 : 795 - 803
  • [20] Electrical and optical properties of CdHgTe films grown by molecular-beam epitaxy on silicon substrates
    Izhnin, I. I.
    Mynbaev, K. D.
    Yakushev, M. V.
    Izhnin, A. I.
    Fitsych, E. I.
    Bazhenov, N. L.
    Shilyaev, A. V.
    Savitskyy, H. V.
    Jakiela, R.
    Sorochkin, A. V.
    Varavin, V. S.
    Dvoretsky, S. A.
    SEMICONDUCTORS, 2012, 46 (10) : 1341 - 1345