Optical Studies of Molecular-Beam Epitaxy-Grown Hg1−xCdxTe with x = 0.7–0.8

被引:0
|
作者
K. D. Mynbaev
A. M. Smirnov
N. L. Bazhenov
N. N. Mikhailov
V. G. Remesnik
M. V. Yakushev
机构
[1] Ioffe Institute,
[2] ITMO University,undefined
[3] A.V. Rzhanov Institute of Semiconductor Physics of SB RAS,undefined
来源
Journal of Electronic Materials | 2020年 / 49卷
关键词
HgCdTe; luminescence; defects; alloy disorder;
D O I
暂无
中图分类号
学科分类号
摘要
Optical transmission, photoluminescence and photoconductivity were used to study Hg1−xCdxTe with x = 0.7–0.8 (bandgap 0.8–1.1 eV at 300 K) grown by molecular-beam epitaxy. The studied material, which included layers used as spacers and barriers in potential- and quantum-well structures, showed a considerable degree of alloy disorder similar to narrower-bandgap HgCdTe grown by the same method. The observed disorder seemed to have no effect on the structural properties of the material and its optical absorption. Optimization of the growth technology of wider-bandgap HgCdTe should help improve the quality of potential- and quantum-well structures based on this material.
引用
收藏
页码:4642 / 4646
页数:4
相关论文
共 48 条
  • [1] Optical Studies of Molecular-Beam Epitaxy-Grown Hg1-xCdxTe with x=0.7-0.8
    Mynbaev, K. D.
    Smirnov, A. M.
    Bazhenov, N. L.
    Mikhailov, N. N.
    Remesnik, V. G.
    Yakushev, M. V.
    JOURNAL OF ELECTRONIC MATERIALS, 2020, 49 (08) : 4642 - 4646
  • [2] ORIGIN OF VOID DEFECTS IN HG1-XCDXTE GROWN BY MOLECULAR-BEAM EPITAXY
    ZANDIAN, M
    ARIAS, JM
    BAJAJ, J
    PASKO, JG
    BUBULAC, LO
    DEWAMES, RE
    JOURNAL OF ELECTRONIC MATERIALS, 1995, 24 (09) : 1207 - 1210
  • [3] Photoluminescence of Hg1-xCdxTe Based Heterostructures Grown by Molecular-Beam Epitaxy
    Mynbaev, K. D.
    Bazhenov, N. L.
    Ivanov-Omskii, V. I.
    Mikhailov, N. N.
    Yakushev, M. V.
    Sorochkin, A. V.
    Remesnik, V. G.
    Dvoretsky, S. A.
    Varavin, V. S.
    Sidorov, Yu. G.
    SEMICONDUCTORS, 2011, 45 (07) : 872 - 879
  • [4] Low-temperature activation of As in Hg1−xCdxTe(211) grown on Si by molecular beam epitaxy
    P. Boieriu
    Y. Chen
    V. Nathan
    Journal of Electronic Materials, 2002, 31 : 694 - 698
  • [5] Electrical and optical studies of a tellurium-related defect in molecular-beam epitaxy-grown HgCdTe
    Swiatek, Z.
    Yakushev, M. V.
    Izhnin, I. I.
    Ozga, P.
    Mynbaev, K. D.
    Varavin, V. S.
    Marin, D. V.
    Mikhailov, N. N.
    Dvoretsky, S. A.
    Voitsekhovski, A. V.
    Savytskyy, H. V.
    Bonchyk, O. Yu.
    PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 13 NO 7-9, 2016, 13 (7-9): : 461 - 464
  • [6] Defect reduction in Hg1−xCdxTe grown by molecular beam epitaxy on Cd0.96Zn0.04Te(211)B
    F. Aqariden
    H. D. Shih
    A. M. Turner
    P. K. Liao
    Journal of Electronic Materials, 2001, 30 : 794 - 796
  • [7] Infrared photoconductors fabricated on Hg1-xCdxTe film grown by molecular beam epitaxy
    Ovsyuk, VN
    Suslyakov, AO
    Zakharyash, TI
    Studenikin, SA
    Vasilyev, VV
    Sidorov, YG
    Dvoretsky, SA
    Varavin, VS
    Mikhailov, NN
    Liberman, V
    INFRARED DETECTORS AND FOCAL PLANE ARRAYS IV, 1996, 2746 : 277 - 285
  • [8] Threading and misfit-dislocation motion in molecular-beam epitaxy-grown HgCdTe epilayers
    M. Carmody
    D. Lee
    M. Zandian
    J. Phillips
    J. Arias
    Journal of Electronic Materials, 2003, 32 : 710 - 716
  • [9] Minority carrier lifetime and noise in abrupt molecular-beam epitaxy-grown HgCdTe heterostructures
    Sewell, R
    Musca, CA
    Dell, JM
    Faraone, L
    Józwikowski, K
    Rogalski, A
    JOURNAL OF ELECTRONIC MATERIALS, 2003, 32 (07) : 639 - 645
  • [10] Minority carrier lifetime and noise in abrupt molecular-beam epitaxy-grown HgCdTe heterostructures
    R. Sewell
    C. A. Musca
    J. M. Dell
    L. Faraone
    K. Józwikowski
    A. Rogalski
    Journal of Electronic Materials, 2003, 32 : 639 - 645