Mutation Testing for Effective Verification of Digital Components of Physical Systems
被引:0
作者:
N. G. Kushik
论文数: 0引用数: 0
h-index: 0
机构:National Research Tomsk State University,
N. G. Kushik
N. V. Evtushenko
论文数: 0引用数: 0
h-index: 0
机构:National Research Tomsk State University,
N. V. Evtushenko
S. N. Torgaev
论文数: 0引用数: 0
h-index: 0
机构:National Research Tomsk State University,
S. N. Torgaev
机构:
[1] National Research Tomsk State University,
[2] National Research Tomsk Polytechnic University,undefined
[3] V. E. Zuev Institute of Atmospheric Optics of the Siberian Branch of the Russian Academy of Sciences,undefined
来源:
Russian Physics Journal
|
2015年
/
58卷
关键词:
digital components;
FPGA technology;
verification;
testing;
mutants;
D O I:
暂无
中图分类号:
学科分类号:
摘要:
Digital components of modern physical systems are often designed applying circuitry solutions based on the field programmable gate array technology (FPGA). Such (embedded) digital components should be carefully tested. In this paper, an approach for the verification of digital physical system components based on mutation testing is proposed. The reference description of the behavior of a digital component in the hardware description language (HDL) is mutated by introducing into it the most probable errors and, unlike mutants in high-level programming languages, the corresponding test case is effectively derived based on a comparison of special scalable representations of the specification and the constructed mutant using various logic synthesis and verification systems.