Optical investigation of ultrathin Al2O3 films grown on GaAs(100) substrates

被引：0
|
作者：
Seredin P.V. [1 ]
Goloshchapov D.L. [1 ]
Lukin A.N. [1 ]
Arsentjev I.N. [2 ]
Tarasov I.S. [2 ]
机构：
[1] Voronezh State University, Voronezh
[2] Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. Petersburg
来源：
Bulletin of the Russian Academy of Sciences: Physics | 2015年 / 79卷 / 02期
关键词：
GaAs; Antireflection Coating; Metal Insulator Semiconductor; Refractive Index Dispersion; High Power Semiconductor Laser;
D O I：
10.3103/S1062873815020239
中图分类号：
学科分类号：
摘要：
The optical and structural properties of ultrathin aluminum oxide films grown on GaAs(100) substrates are studied by means of IR and UV spectroscopy. It is shown experimentally that such films are highly transparent to optical radiation in the infrared, visible, and ultraviolet regions, and are potentially of value in creating antireflection coatings for mirrors of high-power semiconductor lasers based on AIIIBV. © 2015, Allerton Press, Inc.
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页码：223 / 226
页数：3
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