Phase contrast in tapping-mode scanning force microscopy

被引：0
|
作者：
R. García
J. Tamayo
M. Calleja
F. García
机构：
[1] Instituto de Microelectrónica de Madrid,
[2] CNM,undefined
[3] CSIC,undefined
[4] Isaac Newton 8,undefined
[5] 28760 Tres Cantos,undefined
[6] Madrid,undefined
[7] Spain (E-mail: rgarcia@imm.cnm.csic.es),undefined
来源：
Applied Physics A | 1998年 / 66卷
关键词：
PACS: 61.16.Ch; 62.20.+k; 81.40.Pq;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：S309 / S312
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