Use of NON-PARAMETRIC Item Response Theory to develop a shortened version of the Positive and Negative Syndrome Scale (PANSS)

被引：0

作者：

Anzalee Khan

Charles Lewis

Jean-Pierre Lindenmayer

机构：

[1] Fordham University,Department of Psychometrics

[2] ProPhase,New York University

[3] LLC,undefined

[4] School of Medicine,undefined

[5] Nathan S. Kline Institute for Psychiatric Research,undefined

[6] Manhattan Psychiatric Center,undefined

[7] Educational Testing Services,undefined

[8] ETS,undefined

来源：

BMC Psychiatry | / 11卷

关键词：

Item Response Theory Model; General Psychopathology; Item Response Theory Analysis; Negative Subscale; Item Characteristic Curf;

D O I：

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中图分类号：

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摘要：

引用

共 89 条

[1]

Kay SR(1986)Positive and negative syndromes in schizophrenia as a function of chronicity Acta Psychiatric Scandinavia 74 507-518

[2]

Fiszbein A(2006)Factor structure and external validity of the PANSS revisited Schizop Research 82 213-223

[3]

Lindenmayer JP(2007)Schizophrenia: Measurements of Psychopathology Psychiatric Clinics of North America 30 339-363

[4]

Opler L(1988)Reliability and validity of the positive and negative syndrome scale for schizophrenics Psych Res 23 99-110

[5]

Van den Oord EJ(1994)Psychometric properties of the positive and negative syndrome scale (PANSS) in schizophrenia Psychiatry Research 53 31-40

[6]

Rujescu D(1986)Negative and positive schizophrenic syndromes after the acute phase: a prospective follow-up Comp Psychiatry 27 276-286

[7]

Robles JR(1987)The positive and negative syndrome scale (PANSS) for schizophrenia Schiz Bulletin 13 261-276

[8]

Giegling I(2007)Item response analysis of the Positive and Negative Syndrome Scale BMC Psychiatry 15 7-66

[9]

Birrell C(1996)The new rules of measurement Psychol Assessment 8 341-349

[10]

Bukszár J(1998)Progress in the technology of measurement: Applications of Item Response models Psych Assessment 10 345-359