X-Ray diffraction line profile analysis of the microstructure of micro- and nanosized alumina particles

被引：0
|
作者：
Tarasova E.Y. [1 ]
Kuznetsov S.I. [1 ]
Panin A.S. [1 ]
Nefedov S.A. [2 ]
机构：
[1] Lebedev Physical Institute, Samara Branch, Russian Academy of Sciences, Samara
[2] Korolev Samara National Research University, Samara
来源：
Bulletin of the Russian Academy of Sciences: Physics | 2017年 / 81卷 / 11期
关键词：
D O I：
10.3103/S1062873817110193
中图分类号：
学科分类号：
摘要：
X-ray diffraction line profile analysis is adapted to investigate the microstructure of alumina. The structure of electrocorundum and corundum powders produced from pseudoboehmite with submicronic and nanometer-sized particles is analyzed. The lognormal size distribution parameters and their dependence on the conditions of corundum synthesis are determined. The structure of dislocations in corundum with different synthesis prehistories is analyzed, and structural features of the studied material are revealed. © 2017, Allerton Press, Inc.
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页码：1363 / 1369
页数：6
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