Polytherms of angles of wetting by tin-strontium melts for aluminum films on silicon before and after photon annealing

被引:1
|
作者
Dalakova N.V. [1 ]
Elekoeva K.M. [2 ]
Kashezhev A.Z. [3 ]
Manukyants A.R. [2 ]
Ponegev M.Kh. [3 ]
Prokhorenko A.D. [2 ]
Sozaev V.A. [2 ,3 ]
机构
[1] B. I. Verkin Institute for Low Temperature Physics and Engineering, National Academy of Sciences of Ukraine
[2] North Caucasus Institute of Mining and Metallurgy (STU), Vladikavkaz
[3] Kh. M. Berbekov Kabardino-Balkarian State University, Nalchik
关键词
Strontium; Annealing Time; Lead Free Solder; Aluminum Film; Metallic Film;
D O I
10.3103/S1062873814040108
中图分类号
学科分类号
摘要
Polytherms of the angles of wetting by Sn-Sr melts for aluminum films on silicon are investigated by the sessile drop method in helium. Such melts are promising for use as lead-free solders in electronics. It is found that the photon annealing of films enhances their wetting. Wetting thresholds are found at temperatures of >850 K for tin-strontium melts spreading over the surfaces of aluminum films on silicon that are preliminarily processed by photon annealing for 4 s. © 2014 Allerton Press, Inc.
引用
收藏
页码:337 / 339
页数:2
相关论文
共 11 条
  • [1] Polytherms of Angles of Aluminum and Aluminum-Lithium Alloy Wetting by Tin-Based Melts
    Dalakova, N. V.
    Elekoeva, K. M.
    Kashezhev, A. Z.
    Manukyants, A. R.
    Prokhorenko, A. D.
    Ponezhev, M. Kh.
    Sozaev, V. A.
    JOURNAL OF SURFACE INVESTIGATION, 2014, 8 (02): : 360 - 363
  • [2] Polytherms of angles of copper wetting by tin- and zinc-based melts
    Kambolov D.A.
    Kashezhev A.Z.
    Kutuev R.A.
    Manukyants A.R.
    Ponegev M.K.
    Sozaev V.A.
    Shermetov A.K.
    Sozaev, V.A. (sozaeff@mail.ru), 2016, Izdatel'stvo Nauka (10): : 1276 - 1279
  • [3] Temperature dependence of angles of wetting of silicon with tin-barium melts
    Dalakova N.V.
    Elekoeva K.M.
    Kashezhev A.Z.
    Ponegev M.Kh.
    Sozaev V.A.
    Bulletin of the Russian Academy of Sciences: Physics, 2011, 75 (08) : 1089 - 1091
  • [4] Optical properties and microstructure of TiN thin films before and after annealing
    Abd El-Fattah, Hanan A.
    Shazly, Mostafa H.
    El Mahallawi, Iman S.
    Khalifa, Waleed A.
    MATERIALS EXPRESS, 2019, 9 (01) : 15 - 26
  • [5] Optical Properties and Microstructure of TiNxOy and TiN Thin Films before and after Annealing at Different Conditions
    Abd El-Fattah, Hanan A.
    El-Mahallawi, Iman S.
    Shazly, Mostafa H.
    Khalifa, Waleed A.
    COATINGS, 2019, 9 (01):
  • [6] Ellipsometric analysis of ion-implanted polycrystalline silicon films before and after annealing
    Lioudakis, E
    Nassiopoulou, A
    Othonos, A
    THIN SOLID FILMS, 2006, 496 (02) : 253 - 258
  • [7] The characteristics before and after annealing of amorphous silicon films prepared by ECR plasma CVD
    Kang, M
    Kim, J
    Lim, T
    Oh, I
    Jeon, B
    Jung, I
    An, C
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 1997, 221 (01) : 103 - 105
  • [8] Wetting Characteristics of Aluminum Droplets Before and After Embedding Carbon Atoms on the Surface of Heterologous Silicon Carbide
    Lv, Yi
    Shen, ShiLong
    Liao, Feng
    Liu, Sheng
    JOURNAL OF ELECTRONIC MATERIALS, 2024, 53 (02) : 652 - 660
  • [9] Wetting Characteristics of Aluminum Droplets Before and After Embedding Carbon Atoms on the Surface of Heterologous Silicon Carbide
    Yi Lv
    ShiLong Shen
    Feng Liao
    Sheng Liu
    Journal of Electronic Materials, 2024, 53 : 1333 - 1343
  • [10] Influences of aluminum doping on the microstructures and electrical properties of tantalum nitride thin films before and after annealing
    Wang, Kao-Yuan
    Chang, Ting-Chang
    Chen, Wen-Chung
    Zhang, Yong-Ci
    Tseng, Yi-Ting
    Yang, Chih-Cheng
    Lin, Chun-Chu
    Wu, Pei-Yu
    Tan, Yung-Fang
    Tsai, Tsung-Ming
    VACUUM, 2022, 197