Internal Electric Field Behavior of Cadmium Zinc Telluride Radiation Detectors Under High Carrier Injection

被引:0
作者
G. Yang
A. E. Bolotnikov
G. S. Camarda
Y. Cui
A. Hossain
K. H. Kim
R. Gul
R. B. James
机构
[1] Brookhaven National Laboratory,
来源
Journal of Electronic Materials | 2011年 / 40卷
关键词
CZT; Pockels effect; electric field; hole trapping; polarization;
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学科分类号
摘要
The behavior of the internal electric field of nuclear-radiation detectors substantially affects detector performance. We investigated the distribution of the internal field in cadmium zinc telluride (CZT) detectors under high carrier injection. We noted the build-up of a space-charge region near the cathode that produces a built-in field opposing the applied field. Its presence entails the collapse of the electric field in the rest of the detector, other than the portion near the cathode. Such a space-charge region originates from serious hole trapping in CZT. The device’s operating temperature greatly affects the width of the space-charge region. With increasing temperature from 5°C to 35°C, its width expanded from about one-sixth to one-half of the total depth of the detector.
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页码:1689 / 1692
页数:3
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