Electron structure of thin fullerene films deposited by various methods

被引：0
|
作者：
A. L. Shakhmin
A. M. Khodorkovskii
S. V. Murashov
T. O. Artamonova
A. V. Golod
机构：
[1] State Scientific Center of Applied Chemistry,Ioffe Physicotechnical Institute
[2] Russian Academy of Sciences,undefined
来源：
Technical Physics Letters | 2001年 / 27卷
关键词：
Helium; Fullerene; Energy Loss; Fine Structure; Valence Band;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The valence-band photoelectron spectra and the photoelectron energy loss spectra behind the C1s peak in the X-ray photoelectron spectra were studied in thin fullerene films deposited by various methods. The fine structure in the density of states near the valence band bottom observed for the fullerene films deposited by the method of pulsed supersonic molecular beam (SMB) with a helium carrier may be indicative of the presence of a long-range order. The spectra of π-plasmon losses in the films obtained by methods of thermal and SMB deposition exhibit a significant difference that can be related to a closer packing of C60 molecules in the latter case.
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页码：87 / 89
页数：2
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