Control of degradation processes in electronic devices and prediction of their reliability

被引：0
|
作者：
V. K. Aladinskii
A. R. Kasimov
机构：
来源：
Measurement Techniques | 1998年 / 41卷
关键词：
Leakage Current; Threshold Voltage; Microwave Pulse; Informative Parameter; Effective Lifetime;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A method is proposed for controlling degradation processes and the reliability of electronic devices with the aid of a system of informative parameters. Application of γ radiation improves the sensitivity of the method.
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页码：61 / 64
页数：3
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