Ion-beam analysis for cultural heritage on the AGLAE facility: impact of PIXE/RBS combination

被引：0
作者：
J. Salomon
J.-C. Dran
T. Guillou
B. Moignard
L. Pichon
P. Walter
F. Mathis
机构：
[1] Centre de Recherche et de Restauration des Musées de France,Centre Européen d’Archéométrie, Institut de Physique Nucléaire, Atomique et de Spectroscopie
[2] CNRS,undefined
[3] UMR 171,undefined
[4] Université de Liège,undefined
来源：
Applied Physics A | 2008年 / 92卷
关键词：
PIXE; Nuclear Reaction Analysis; PIXE Analysis; Cultural Heritage Object; Simultaneous Implementation;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The combination of particle-induced X-ray emission (PIXE) and Rutherford backscattering (RBS) is particularly fruitful for the study of cultural heritage objects. Several set-ups have been developed at the AGLAE facility of the Louvre Laboratory to implement these techniques with an external beam. Successively have been tested the simultaneous use of PIXE and RBS with a single beam of protons, the sequential application of PIXE with protons and RBS with 4He2+ ions and finally the simultaneous implementation of PIXE and RBS with high-energy 4He2+ ions. Several examples illustrate the benefits of these combinations of techniques.
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页码：43 / 50
页数：7
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