Comparison of functionalized AlGaN/GaN HEMT sensor for the detection of various heavy metal ions

被引:0
作者
Xuecheng Jiang
Chunlei Wei
Yan Gu
Xiaohu Dong
Zhijian Xie
Qi Zhang
Chun Zhu
Weiying Qian
Naiyan Lu
Guoqing Chen
Guofeng Yang
机构
[1] Jiangsu Provincial Research Center of Light Industrial Optoelectronic Engineering and Technology,School of Science
[2] Jiangnan University,undefined
[3] Wuxi Kelaiwo Intelligent Equipment Co.,undefined
[4] Ltd.,undefined
[5] Jiangsu Xinguanglian Technology Co.,undefined
[6] Ltd.,undefined
来源
Applied Physics A | 2022年 / 128卷
关键词
AlGaN/GaN HEMT; Sensor; Heavy metal ion; Sensitivity;
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学科分类号
摘要
We report and compare a sensitive heavy metal ion sensor for copper ion (Cu2+), iron ion (Fe3+), lead ion (Pb2+) and cadmium ion (Cd2+) detection. The sensor consists of AlGaN/GaN high electron mobility transistor (HEMT) with L-cysteine functionalized active region on the gate. The sensor exhibits fast and stable response after the introduction of various heavy metal ions ranging from 0 mg/L to 20 mg/L to combine with the modifier to form stable complexes. The current response of the HEMT device shows a related behavior that decreases with increasing concentration of introduced heavy metal ions. Furthermore, the AlGaN/GaN HEMT-based sensor exhibited high sensitivities of 92.32 µA/(mg/L), 760.22 µA/(mg/L), 137.05 µA/(mg/L) and 63.63 µA/(mg/L) for the detection of Cu2+, Fe3+, Pb2+ and Cd2+, respectively. Therefore, the proposed functionalized AlGaN/GaN HEMT device displays potential in the application of efficient, fast and convenient detection of heavy metal ions.
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