Intralayer and interlayer electron–phonon interactions in twisted graphene heterostructures

被引:0
作者
G. S. N. Eliel
M. V. O. Moutinho
A. C. Gadelha
A. Righi
L. C. Campos
H. B. Ribeiro
Po-Wen Chiu
K. Watanabe
T. Taniguchi
P. Puech
M. Paillet
T. Michel
P. Venezuela
M. A. Pimenta
机构
[1] UFMG,Departamento de Física, Universidade Federal de Minas Gerais
[2] Universidade Federal do Rio de Janeiro,Núcleo Multidisciplinar de Pesquisas em Computação
[3] UFF, NUMPEX
[4] Mackenzie Presbyterian University,COMP, Campus Duque de Caxias
[5] National Tsing Hua University,Instituto de Física, Universidade Federal Fluminense
[6] National Institute for Materials Science,MackGraphe
[7] University of Toulouse, Graphene and Nanomaterials Research Center
[8] University of Montpellier,CEMES/CNRS
来源
Nature Communications | / 9卷
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摘要
The understanding of interactions between electrons and phonons in atomically thin heterostructures is crucial for the engineering of novel two-dimensional devices. Electron–phonon (el–ph) interactions in layered materials can occur involving electrons in the same layer or in different layers. Here we report on the possibility of distinguishing intralayer and interlayer el–ph interactions in samples of twisted bilayer graphene and of probing the intralayer process in graphene/h-BN by using Raman spectroscopy. In the intralayer process, the el–ph scattering occurs in a single graphene layer and the other layer (graphene or h-BN) imposes a periodic potential that backscatters the excited electron, whereas for the interlayer process the el–ph scattering occurs between states in the Dirac cones of adjacent graphene layers. Our methodology of using Raman spectroscopy to probe different types of el–ph interactions can be extended to study any kind of graphene-based heterostructure.
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