The threshold of nanopore formation in ion-implanted platinum

被引:0
作者
V. A. Ivchenko
机构
[1] Ural Federal University,Institute of Electrophysics, Ural Branch
[2] Russian Academy of Sciences,undefined
来源
Technical Physics Letters | 2012年 / 38卷
关键词
Atomic Layer; Technical Physic Letter; Subsurface Layer; Irradiate Surface; Radiation Stability;
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摘要
The method of field-ion microscopy was used to determine the threshold of nanopore formation in ion-implanted platinum. The threshold for ion-implanted platinum corresponds to fluence F = 1017 ions/cm2. The size of nanopores is determined: 1–5 nm (transverse) and 1–9 nm (lateral, across the target depth). It is found that up to 40% of nanopores are located in the subsurface layer with a thickness of 10 nm. The obtained results can be used for prediction of radiation stability of materials based on fcc metals.
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页码:822 / 824
页数:2
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