Fabrication and characterization of ZnO:Sb/n-ZnO homojunctions

被引:0
作者
A. Marzouki
C. Sartel
N. Haneche
G. Patriarche
A. Lusson
V. Sallet
M. Oueslati
机构
[1] Unité de Nanomatériaux Et Photonique,Centre de Nanosciences Et de Nanotechnologies (C2N)
[2] Faculté Des Sciences de Tunis,undefined
[3] Université Paris-Saclay,undefined
[4] CNRS,undefined
[5] Université de Versailles St Quentin en Yvelines,undefined
[6] Groupe D’Etude de La Matière Condensée (GEMAC),undefined
[7] Université Paris-Saclay,undefined
[8] CNRS,undefined
来源
Applied Physics A | 2021年 / 127卷
关键词
ZnO; MOVPE; Triethylantimony; Thin films; Antimony doping; Photoluminescence; SIMS; Diode;
D O I
暂无
中图分类号
学科分类号
摘要
Antimony-doped ZnO layers have been grown by metalorganic vapour-phase epitaxy on sapphire and ZnO substrates at high-temperature (950 °C) and low-pressure conditions (50 torr). Nitrous oxide and diethyl-zinc have been used as oxygen and zinc precursors, respectively. The incorporation of antimony has been obtained from the decomposition of triethylantimony doping molecules added in the gas phase. High Sb concentrations were measured from 1019 to 1021 at/cm−3 using secondary ion mass spectroscopy and depend on the nature and the orientation on the substrate. Low-temperature photoluminescence spectra of Sb-doped layers exhibit donor–acceptor pair transitions at 3.253 eV. Unlike Raman spectra of nitrogen-doped ZnO layers which show several local vibrational modes related to nitrogen incorporation, these modes were found to be absent in the antimony-doped ZnO layers. Transmission electron microscopy suggests that the incorporation of Sb is partly related to dislocations and other structural defects. All together, the characterizations suggest the formation of acceptor dopant–defect complexes, such as SbZn-2VZn. Finally, ZnO:Sb/n-ZnO homojunction diodes have been successfully elaborated on ZnO substrate. The current–voltage characteristics of the device exhibit a rectifying behaviour with a turn-on voltage of 3 V.
引用
收藏
相关论文
共 50 条
  • [21] Fabrication and Energy Band Alignment of n-ZnO/p-CuI Heterojunction
    Ding, K.
    Hu, Q. C.
    Chen, D. G.
    Zheng, Q. H.
    Xue, X. G.
    Huang, F.
    IEEE ELECTRON DEVICE LETTERS, 2012, 33 (12) : 1750 - 1752
  • [22] Electrical characterization of Au/n-ZnO Schottky contacts on n-Si
    Aydogan, S.
    Cinar, K.
    Asil, H.
    Coskun, C.
    Tueruet, A.
    JOURNAL OF ALLOYS AND COMPOUNDS, 2009, 476 (1-2) : 913 - 918
  • [23] Thermally stable Ir/n-ZnO Schottky diodes
    Young, S. J.
    Chang, S. J.
    Ji, L. W.
    Meen, T. H.
    Hsiao, C. H.
    Liu, K. W.
    Chen, K. J.
    Hu, Z. S.
    MICROELECTRONIC ENGINEERING, 2011, 88 (01) : 113 - 116
  • [24] Fabrication and Temperature Dependent Electrical Characterization of n-ZnO Nanowires/p-Si Substrate Heterojunction Diodes
    Algarni, H.
    Badran, R. I.
    Khan, M. Ajmal
    Hassen, Fredj
    Kim, S. H.
    Umar, Ahmad
    JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, 2017, 12 (10) : 1162 - 1166
  • [25] Scalable fabrication of nanostructured p-Si/n-ZnO heterojunctions by femtosecond-laser processing
    Georgiadou, D. G.
    Ulmeanu, M.
    Kompitsas, M.
    Argitis, P.
    Kandyla, M.
    MATERIALS RESEARCH EXPRESS, 2014, 1 (04):
  • [26] Fabrication of n-ZnO/p-Si (100) and n-ZnO:Al/p-Si (100) Heterostructures and Study of Current-Voltage, Capacitance-Voltage and Room-Temperature Photoluminescence
    Shah, M. A. H.
    Khan, M. K. R.
    Karim, A. M. M. Tanveer
    Rahman, M. M.
    Kamruzzaman, M.
    JOURNAL OF ELECTRONIC MATERIALS, 2018, 47 (01) : 879 - 886
  • [27] Fabrication and Characterization of Sb Doped Large-Scale ZnO Nanorods
    Feng Yu
    Feng Qiu-Ju
    Wang Jue
    Jiang Jun-Yan
    Tao Peng-Cheng
    Liu Shuang
    Xu Rui-Zhuo
    Li Meng-Ke
    Song Zhe
    Sun Jing-Chang
    CHINESE JOURNAL OF INORGANIC CHEMISTRY, 2011, 27 (07) : 1245 - 1248
  • [28] Rectifying ZnO-Na/ZnO-Al aerogels p-n homojunctions
    Mukai, Karla N.
    Bernardes, Joseane C.
    Muller, Daliana
    Rambo, Carlos R.
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2022, 33 (10) : 7738 - 7749
  • [29] Fabrication and characterization of p-n junctions based on ZnO and CuPc
    Gupta, R. K.
    Yakuphanoglu, F.
    Ghosh, K.
    Kahol, P. K.
    MICROELECTRONIC ENGINEERING, 2011, 88 (10) : 3067 - 3069
  • [30] Structural, Optical, and Electrical Characterization of Al/n-ZnO/p-Si/Al Heterostructures
    Kumar, Rajender
    Chand, Subhash
    JOURNAL OF ELECTRONIC MATERIALS, 2015, 44 (01) : 194 - 201