Enhancement of the measurement sensitivity in multiple-exposure holographic interferometry

被引：0
作者：
A. M. Lyalikov
机构：
[1] Kupala State University,
来源：
Optics and Spectroscopy | 2002年 / 93卷
关键词：
Spatial Frequency; Measurement Sensitivity; Diffraction Spectrum; Diffraction Order; Nonlinear Condition;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Specific features of reconstruction of enhanced-sensitivity interferograms in the optical processing of a multiple-exposure hologram recorded under linear conditions are considered. To enhance the measurement sensitivity when visualizing the changes in the state of an object under study that take place during the time between exposures, it is proposed that the holographic structures corresponding to these exposures on a new carrier be rewritten and the double-exposure hologram thus obtained under nonlinear conditions be recorded. The proposed technique of enhancement of the measurement sensitivity was experimentally tested when visualizing a change of the temperature field in a flat glass plate.
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页码：136 / 139
页数：3
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