Report from the Standards for Pathogen Identification via Next-Generation Sequencing (SPIN) Workshop

被引：0

作者：

Nathan D. Olson

Scott A. Jackson

Nancy J. Lin

机构：

[1] Biosystems and Biomaterials Division,

[2] National Institute for Standards and Technology,undefined

来源：

Standards in Genomic Sciences | / 10卷

关键词：

Genome sequencing; Metrology; Next-generation sequencing; Pathogen identification; Reference materials; Standards;

D O I：

暂无

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学科分类号：

摘要：

Next-generation sequencing (NGS) is not routinely used in applied settings due to lack of confidence in results. This workshop convened experts to identify measurement challenges impeding NGS implementation and potential standards-based solutions to address these challenges.

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