Fabrication and characterization of nanocrystalline Al, Co:ZnO thin films by a sol–gel dip coating

The consequence of annealing on the micro-structural and electrochemical characteristics of Al doped CoZnO thin films deposited by sol–gel dip coating technique are studied. X-ray diffraction indicates that films have a hexagonal wurtzite structure oriented towards the (100). Optical properties of films are recorded by transmission curves utilising a UV–VIS spectrophotometer. The investigation of the optical transmission spectra indicates that the band gap of the films decrease from 3.99 eV to minimum 3.83 eV upon annealing. All films show room temperature ferromagnetism whose magnetization increases with annealing. Dip coated films possess polycrystalline nanosized grains with porous morphology.