Anomalous dispersion in nanocomposite films at the surface plasmon resonance

被引：0

作者：

R. Serna

J. Gonzalo

C.N. Afonso

J.C.G. de Sande

机构：

[1] Instituto de Optica,

[2] CSIC,undefined

[3] Serrano 121,undefined

[4] 28006 Madrid,undefined

[5] Spain,undefined

[6] Ingeniería de Circuitos y Sistemas,undefined

[7] E.U.I.T.T.,undefined

[8] U.P.M.,undefined

[9] Ctra. de Valencia km 7.5,undefined

[10] 28031 Madrid,undefined

[11] Spain,undefined

来源：

Applied Physics B | 2001年 / 73卷

关键词：

PACS: 61.46+w; 78.66.Sq; 81.15.Fg.;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Nanocomposite thin films formed by Cu nanocrystals (NCs) embedded in an amorphous aluminium oxide (Al2O3) host have been prepared by alternate pulsed laser deposition. Spectroscopic ellipsometry is used to determine the effective refractive index (n=n+ik). The extinction coefficient is non-negligible and shows a broad absorption band related to the surface plasmon resonance. In the neighbourhood of this wavelength, the real part of the refractive index undergoes an anomalous dispersion, leading to a significant increase of the n value of the composite compared to that of the host. When the Cu content is low enough, about 2 at. %, the use of an effective medium approach combined with a regression method allows us to determine the metal content and film thickness from the ellipsometric measurements. For larger concentrations this approach is no longer valid.

引用

页码：339 / 343

页数：4