Generalized Null-Ellipsometry in the Polarizer–Sample–Analyzer Scheme

被引：0
|
作者：
M. V. Sopinskyy
G. P. Ol’khovik
机构：
[1] Lashkarev Institute of Semiconductor Physics,
[2] National Academy of Sciences of Ukraine,undefined
来源：
Optics and Spectroscopy | 2022年 / 130卷
关键词：
anisotropy; anisotropic Jones matrix; generalized ellipsometry; standard ellipsometry; photometric ellipsometry;
D O I：
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学科分类号：
摘要：
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页码：92 / 101
页数：9
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