Application of X-Ray Diffraction Methods for Refractory Raw Material Quality Control

被引：0
|
作者：
T. I. Ivanova
V. N. Maslov
S. I. Gershkovich
F. R. Iksanov
A. A. Kovalenko
A. V. Tsunaeva
S. A. Markelov
机构：
[1] AO Scientific Center Burevestnik,
[2] AO Borovichi Refractory Combine,undefined
来源：
Refractories and Industrial Ceramics | 2021年 / 62卷
关键词：
crystalline refractories; mineral raw material; x-ray diffraction; qualitative and quantitative phase analyses; Rietveld structural refinement;
D O I：
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中图分类号：
学科分类号：
摘要：
The majority of refractory materials and raw minerals used for their production are crystalline substances. X-ray diffraction techniques can be used successfully for qualitative and quantitative determination of their mineral composition and for analysis of the technologically significant structural features that are most important in a production process. Examples are considered for the main types of refractory materials and are studied with the full-profile Rietveld refinement method in order to reveal control parameters during their production. It is concluded that structural properties of mineral phases should be taken into account that have a considerable effect on refractory material mechanical properties.
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页码：108 / 115
页数：7
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