Equivalent linear logistic test models

被引：0

作者：

Timo M. Bechger

Huub H. F. M. Verstralen

Norman D. Verhelst

机构：

[1] Cito,

[2] National Institute for Educational Measurement,undefined

[3] Cito,undefined

来源：

Psychometrika | 2002年 / 67卷

关键词：

item response theory (IRT); linear logistic test model; Lagrange multiplier test;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

This paper is about the Linear Logistic Test Model (LLTM). We demonstrate that there are infinitely many equivalent ways to specify a model. An implication is that there may well be many ways to change the specification of a given LLTM and achieve the same improvement in model fit. To illustrate this phenomenon, we analyze a real data set using a Lagrange multiplier test for the specification of the model. This Lagrange multiplier test is similar to the modification index used in structural equation modeling.

引用

页码：123 / 136

页数：13

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