Equivalent linear logistic test models

被引:0
|
作者
Timo M. Bechger
Huub H. F. M. Verstralen
Norman D. Verhelst
机构
[1] Cito,
[2] National Institute for Educational Measurement,undefined
[3] Cito,undefined
来源
Psychometrika | 2002年 / 67卷
关键词
item response theory (IRT); linear logistic test model; Lagrange multiplier test;
D O I
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中图分类号
学科分类号
摘要
This paper is about the Linear Logistic Test Model (LLTM). We demonstrate that there are infinitely many equivalent ways to specify a model. An implication is that there may well be many ways to change the specification of a given LLTM and achieve the same improvement in model fit. To illustrate this phenomenon, we analyze a real data set using a Lagrange multiplier test for the specification of the model. This Lagrange multiplier test is similar to the modification index used in structural equation modeling.
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页码:123 / 136
页数:13
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