Equivalent linear logistic test models

被引：0
|
作者：
Timo M. Bechger
Huub H. F. M. Verstralen
Norman D. Verhelst
机构：
[1] Cito,
[2] National Institute for Educational Measurement,undefined
[3] Cito,undefined
来源：
Psychometrika | 2002年 / 67卷
关键词：
item response theory (IRT); linear logistic test model; Lagrange multiplier test;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
This paper is about the Linear Logistic Test Model (LLTM). We demonstrate that there are infinitely many equivalent ways to specify a model. An implication is that there may well be many ways to change the specification of a given LLTM and achieve the same improvement in model fit. To illustrate this phenomenon, we analyze a real data set using a Lagrange multiplier test for the specification of the model. This Lagrange multiplier test is similar to the modification index used in structural equation modeling.
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页码：123 / 136
页数：13
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