An ‘aqueous route’ for the fabrication of low-temperature-processable oxide flexible transparent thin-film transistors on plastic substrates

被引:1
作者
Young Hwan Hwang
Jin-Suk Seo
Je Moon Yun
HyungJin Park
Shinhyuk Yang
Sang-Hee Ko Park
Byeong-Soo Bae
机构
[1] Korea Advanced Institute of Science and Technology,Department of Materials Science and Engineering
[2] Oxide Electronics Research Team,undefined
[3] Electronics and Telecommunications Research Institute,undefined
[4] 3Current address: Printed Electronics Team,undefined
[5] Korea Electronics Technology Institute,undefined
[6] Jeonju,undefined
[7] Korea.,undefined
来源
NPG Asia Materials | 2013年 / 5卷
关键词
flexible electronics; oxide semiconductor; solution process;
D O I
暂无
中图分类号
学科分类号
摘要
Metal-oxide semiconductors have attracted considerable attention as next-generation circuitry for displays and energy devices because of their unique transparency and high performance. We propose a simple, novel and inexpensive ‘aqueous route’ for the fabrication of oxide thin-film transistors (TFTs) at low annealing temperatures (that is, <200 °C). These results provide substantial progress toward solution-processed metal-oxide TFTs through naturally formed, unique indium complex and post annealing. The fabricated TFTs exhibited acceptable electrical performance with good large-area uniformity at low temperatures. Additional vacuum annealing facilitated the condensation reaction by effectively removing byproduct water molecules and resulted in the activation of the In2O3 TFT at low annealing temperatures, even temperatures as low as 100 °C. In addition, we have demonstrated that the flexible and transparent oxide TFTs on plastic substrates exhibit good resistance to external gate bias stress.
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页码:e45 / e45
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