Optical properties investigation of [nc-Si:SiO2/SiO2]30 periodic multilayer films

被引：0
|
作者：
Liang Feng
Jiang Zhu
Shenjin Wei
Huanfeng Zhu
Kun Chen
Da Xu
Jing Li
机构：
[1] Fudan University,Department of Optical Science and Engineering
[2] Fudan University,Key Laboratory of Micro and Nano Photonic Structures (Ministry of Education)
来源：
Applied Physics A | 2012年 / 109卷
关键词：
Optical Bandgap; Spectroscopic Ellipsometry; SiO2 Matrix; Spectroscopic Ellipsometry Measurement; Spectroscopic Ellipsometry Data;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The optical properties of 30-layer [nc-Si:SiO2/SiO2]30 periodic films have been studied. The films were prepared by alternately evaporating SiO and SiO2 onto Si(100) substrates, followed by annealing at 1100 ∘C. Spectroscopic ellipsometry spectrum analysis was used to determine the optical constants of the samples via the Forouhi–Bloomer model. The optical bandgap of a single periodic film is calculated. The photoluminescence (PL) spectra of three samples with different thicknesses clearly show that there are two physical origins of the PL process.
引用
收藏
页码：547 / 551
页数：4
相关论文
共 50 条
  • [21] Emission and optical properties of SiO2/Si thin films
    Tashmukhamedova D.A.
    Yusupjanova M.B.
    Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, 2016, 10 (6) : 1273 - 1275
  • [22] SOME OPTICAL PROPERTIES OF SIO2 FILMS ON SI SUBSTRATE
    VANPHUC, D
    ACTA TECHNICA ACADEMIAE SCIENTIARUM HUNGARICAE, 1973, 74 (3-4): : 263 - 274
  • [23] INFLUENCE OF gamma-IRRADIATION ON OPTICAL PROPERTIES OF NITROGEN-DOPED nc-Si/SiO2 STRUCTURES
    Lisovskyy, I. P.
    Litovchenko, V. G.
    Voitovych, M. V.
    Melnik, V. P.
    Khachevich, I. M.
    Voitovych, V. V.
    Povarchuk, V. Yu.
    Mezhennyi, M. V.
    Smirnov, D. I.
    UKRAINIAN JOURNAL OF PHYSICS, 2008, 53 (10): : 997 - 1001
  • [24] Optical excitation and emission processes of Si-QD/SiO2 multilayer films with different SiO2 layer thicknesses
    Guangsheng Fu
    Xinzhan Wang
    Huina Feng
    Wanlei Dai
    Xiang Yu
    Wanbing Lu
    Zicai Zhang
    Wei Yu
    Applied Physics A, 2014, 114 : 861 - 866
  • [25] Optical excitation and emission processes of Si-QD/SiO2 multilayer films with different SiO2 layer thicknesses
    Fu, Guangsheng
    Wang, Xinzhan
    Feng, Huina
    Dai, Wanlei
    Yu, Xiang
    Lu, Wanbing
    Zhang, Zicai
    Yu, Wei
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2014, 114 (03): : 861 - 866
  • [26] Effect of post-annealing in oxygen atmosphere on the photoluminescence properties of nc-Si rich SiO2 films
    Bi, L
    He, Y
    Feng, JY
    JOURNAL OF CRYSTAL GROWTH, 2006, 289 (02) : 564 - 567
  • [27] MICROSTRUCTURAL PROPERTIES OF NC-Si/SiO2 FILMS IN SITU GROWN BY REACTIVE MAGNETRON CO-SPUTTERING
    Lu, Wanbing
    Guo, Shaogang
    Wang, Jiantao
    Li, Yun
    Wang, Xinzhan
    Yu, Gengxi
    Fan, Shanshan
    Fu, Guangsheng
    INTERNATIONAL JOURNAL OF NANOSCIENCE, 2012, 11 (06)
  • [28] Study of optical properties of metallic Au:SiO2 and Ni:SiO2 films
    Wang, Y
    Yan, X
    Zhang, RJ
    Chen, LY
    Zhang, WM
    Qian, DL
    Wang, SY
    Zheng, YX
    Yang, YM
    Dai, N
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1999, 198-99 : 587 - 589
  • [29] Bright luminescence from erbium doped nc-Si/SiO2 superlattices
    Schmidt, M
    Heitmann, J
    Scholz, R
    Zacharias, M
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 2002, 299 : 678 - 682
  • [30] The fabrication of nc-Si/SiO2 multilayers and blue-light emission
    Sui, YP
    Ma, ZY
    Chen, KJ
    Li, W
    Xu, J
    Huang, XF
    ACTA PHYSICA SINICA, 2003, 52 (04) : 989 - 992
12345