Effect of electrostatic discharge on semiconductor devices and subsequent annealing of electrostatic defects

被引：0

作者：

M. I. Gorlov

I. V. Vorontsov

A. V. Andreev

机构：

来源：

Measurement Techniques | 1998年 / 41卷

关键词：

Semiconductor Device; Gate Bias; Storage Capacitor; Electrostatic Discharge; Catastrophic Defect;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The effect of electrostatic discharge on semiconductor devices and of subsequent annealing of electrostatic defects by electrical loading and (or) at high temperatures is discussed. The effect of electrostatic discharge has been described in terms of the human body phantom.

引用

页码：65 / 67

页数：2

共 50 条

[1] Effect of electrostatic discharge on semiconductor devices and subsequent annealing of electrostatic defects
Gorlov, MI
Vorontsov, IV
Andreev, AV
MEASUREMENT TECHNIQUES, 1998, 41 (01) : 65 - 67
[2] Annealing of radiation and electrostatic-discharge damages in semiconductor devices
Gorlov, M.I.
Litvinenko, D.A.
Mikroelektronika, 2002, 31 (05): : 350 - 361
[3] Annealing of Radiation and Electrostatic-Discharge Damages in Semiconductor Devices
Gorlov M.I.
Litvinenko D.A.
Russian Microelectronics, 2002, 31 (5) : 295 - 304
[4] Electrostatic discharge in semiconductor devices: An overview
Vinson, JE
Liou, JJ
PROCEEDINGS OF THE IEEE, 1998, 86 (02) : 399 - 418
[5] Prolog to electrostatic discharge in semiconductor devices: An overview
Esch, J
PROCEEDINGS OF THE IEEE, 1998, 86 (02) : 397 - 398
[6] Electrostatic discharge in semiconductor devices: Protection techniques
Vinson, JE
Liou, JJ
PROCEEDINGS OF THE IEEE, 2000, 88 (12) : 1878 - 1900
[7] ELECTROSTATIC DISCHARGE THERMAL FAILURE IN SEMICONDUCTOR-DEVICES
DWYER, VM
FRANKLIN, AJ
CAMPBELL, DS
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1990, 37 (11) : 2381 - 2387
[8] Electrostatic discharge in semiconductor devices: Overview of circuit protection techniques
Vinson, JE
Liou, JJ
2000 IEEE HONG KONG ELECTRON DEVICES MEETING, PROCEEDINGS, 2000, : 5 - 8
[9] An electrostatic discharge failure mechanism in semiconductor devices, with applications to electrostatic discharge measurements using transmission line pulsing technique
Lee, JC
Hoque, A
Croft, GD
Liou, JJ
Young, R
Bernier, JC
SOLID-STATE ELECTRONICS, 2000, 44 (10) : 1771 - 1781
[10] Electrostatic Doping in Semiconductor Devices
Gupta, Gaurav
Rajasekharan, Bijoy
Hueting, Raymond J. E.
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017, 64 (08) : 3044 - 3055

← 1 2 3 4 5 →