Automatic semiconductor parameter analyzers

被引：0

作者：

V. T. Kremin'

机构：

来源：

Measurement Techniques | 1998年 / 41卷

关键词：

Semiconductor Device; Input Current; Operational Amplifier; Differential Amplifier; Measuring Transducer;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

An automatic semiconductor parameter analyzer based on an IBM AT personal computer is described. The results of measurements are used to compile banks of mathematical models of various semiconductor devices (bipolar and field-effect transistors, junction and Zener diodes) for use in circuit simulating programs such as PSpice.

引用

页码：833 / 836

页数：3