Two-wavelength dispersion holographic lateral-shift interferometry

被引：0
|
作者：
A. M. Lyalikov
机构：
[1] Grodno State University,
来源：
Technical Physics | 2004年 / 49卷
关键词：
Refractive Index; Reconstructed Image; Interference Pattern; Probe Beam; Dispersion Characteristic;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
It is demonstrated that two-wavelength holographic interferometry with a small lateral shift in a grating interferometer makes it possible to study the dispersion characteristics of transparent objects using probe beams with arbitrary wavelengths. Interference patterns reconstructed represent fringes on the reconstructed image of the object, which characterize the value of the derivative of the difference between the refractive indices of the medium under study at the probe wavelengths along the direction of the shift. The results of experiments employing the method proposed are presented.
引用
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页码：1473 / 1476
页数：3
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