Characterization and molecular mapping of Yr52 for high-temperature adult-plant resistance to stripe rust in spring wheat germplasm PI 183527

被引：0
作者：
R. S. Ren
M. N. Wang
X. M. Chen
Z. J. Zhang
机构：
[1] China Agricultural University,Department of Plant Pathology
[2] Washington State University,Department of Plant Pathology
[3] US Department of Agriculture-Agricultural Research Service (USDA-ARS),undefined
[4] Wheat Genetics,undefined
[5] Quality,undefined
[6] Physiology and Disease Research Unit,undefined
来源：
Theoretical and Applied Genetics | 2012年 / 125卷
关键词：
Simple Sequence Repeat Marker; Stripe Rust; Wheat Genotype; Chinese Spring; Infection Type;
D O I：
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中图分类号：
学科分类号：
摘要：
Stripe rust, caused by Puccinia striiformis f. sp. tritici, is one of the most destructive diseases of wheat worldwide. Resistance is the best approach to control the disease. High-temperature adult-plant (HTAP) stripe rust resistance has proven to be race non-specific and durable. However, genes conferring high-levels of HTAP resistance are limited in number and new genes are urgently needed for breeding programs to develop cultivars with durable high-level resistance to stripe rust. Spring wheat germplasm PI 183527 showed a high-level of HTAP resistance against stripe rust in our germplasm evaluations over several years. To elucidate the genetic basis of resistance, we crossed PI 183527 and susceptible wheat line Avocet S. Adult plants of parents, F1, F2 and F2:3 progeny were tested with selected races under the controlled greenhouse conditions and in fields under natural infection. PI 183527 has a single dominant gene conferring HTAP resistance. Resistance gene analog polymorphism (RGAP) and simple sequence repeat (SSR) markers in combination with bulked segregant analysis (BSA) were used to identify markers linked to the resistance gene. A linkage map consisting of 4 RGAP and 7 SSR markers was constructed for the resistance gene using data from 175 F2 plants and their derived F2:3 lines. Amplification of nulli-tetrasomic, ditelosomic and deletion lines of Chinese Spring with three RGAP markers mapped the gene to the distal region (0.86–1.0) of chromosome 7BL. The molecular map spanned a genetic distance of 27.3 cM, and the resistance gene was narrowed to a 2.3-cM interval flanked by markers Xbarc182 and Xwgp5258. The polymorphism rates of the flanking markers in 74 wheat lines were 74 and 30 %, respectively; and the two markers in combination could distinguish the alleles at the resistance locus in 82 % of tested genotypes. To determine the genetic relationship between this resistance gene and Yr39, a gene also on 7BL conferring HTAP resistance in Alpowa, a cross was made between PI 183527 and Alpowa. F2 segregation indicated that the genes were 36.5 ± 6.75 cM apart. The gene in PI 183527 was therefore designed as Yr52. This new gene and flanking markers should be useful in developing wheat cultivars with high-level and possible durable resistance to stripe rust.
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页码：847 / 857
页数：10
相关论文
共 204 条
  • [1] Bariana HS(2006)Identification and characterization of stripe rust resistance gene Theor Appl Genet 112 1143-1148
  • [2] Parry N(2009) in common wheat Theor Appl Genet 119 1119-1128
  • [3] Barclay IR(2005)Identifying QTL for high-temperature adult-plant resistance to stripe rust ( Can J Plant Pathol 27 314-337
  • [4] Loughman R(2007) f. sp. Aust J Agric Res 58 648-655
  • [5] McLean RJ(1995)) in the spring wheat ( Phytopathology 85 567-572
  • [6] Shankar M(1995) L.) cultivar ‘Louise’ Phytopathology 85 573-578
  • [7] Wilson RE(1998)Epidemiology and control of stripe rust [ Theor Appl Genet 97 345-355
  • [8] Willey NJ(2010) f. sp. Can J Plant Pathol 32 315-333
  • [9] Francki M(2004)] on wheat Genetics 166 461-481
  • [10] Carter AH(2009)Challenges and solutions for stripe rust control in the United States Science 323 1357-1360
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