Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements

被引：2
作者：
Romanov D.S. [1 ]
机构：
[1] Department of Computational Mathematics and Cybernetics, Moscow State University, Moscow
来源：
Moscow University Computational Mathematics and Cybernetics | 2015年 / 39卷 / 1期
基金：
俄罗斯基础研究基金会;
关键词：
checking test; circuit of functional elements; easy-to-test circuit; inverse fault; Shannon function;
D O I：
10.3103/S0278641915010057
中图分类号：
学科分类号：
摘要：
A method for synthesizing circuits of functional elements in a special basis which admit complete checking tests of length at most 4 under inverse faults at the outputs of functional elements is proposed. © 2015, Allerton Press, Inc.
引用
收藏
页码：26 / 34
页数：8
相关论文
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