Hydrogen Embrittlement of a Copper Lead in a Diode

被引:0
作者
Arun Kumar
机构
[1] Scanning Electron Analysis Laboratories,
[2] Inc.,undefined
来源
Journal of Failure Analysis and Prevention | 2022年 / 22卷
关键词
Copper; Diodes; Oxygen; OFHC copper; Hydrogen damage and embrittlement;
D O I
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学科分类号
摘要
Diode leads that were to be made from OFHC copper were instead made from copper with high oxygen content. The leads had a nickel underplating, a gold final plating, and were brazed to the diode package in a hydrogen atmosphere. After brazing, the leads became embrittled. SEM examination of the fractured leads revealed voids and some oxidized areas surrounded by ductile fracture areas. High pressure steam pockets observed as voids in the microstructure caused hydrogen embrittlement of the leads. The obvious corrective action was to ensure that the lead material was OFHC copper.
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页码:2117 / 2118
页数:1
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