Mechanism-based design of precursors for focused electron beam-induced deposition

被引:0
作者
Will G. Carden
Hang Lu
Julie A. Spencer
D. Howard Fairbrother
Lisa McElwee-White
机构
[1] University of Florida,Department of Chemistry
[2] Johns Hopkins University,Department of Chemistry
[3] United States Naval Academy,Department of Chemistry
来源
MRS Communications | 2018年 / 8卷
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摘要
Focused electron beam-induced deposition (FEBID) is capable of producing metal-containing nanostructures with lateral resolution on the sub-nanometer scale. Practical application of this nanofabrication technique has been hindered by ligand-derived contamination from precursors developed for thermal deposition methods. Mechanistic insight into FEBID through surface science studies and gas-phase electron-molecule interactions has begun to enable the design of custom FEBID precursors. These studies have shown that precursors designed to decompose under electron irradiation can produce high-purity FEBID deposits. Herein, we highlight the progress in FEBID precursor development with several examples that incorporate this mechanism-based design approach.
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页码:343 / 357
页数:14
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共 511 条
[1]  
Van Dorp W(2008)Growth behavior near the ultimate resolution of nanometer-scale focused electron beam-induced deposition Nanotechnology 19 225305-15359
[2]  
Hagen C(2006)Focused, nanoscale electron-beam-induced deposition and etching Crit. Rev. Solid State Mater. Sri 31 55-undefined
[3]  
Crazier P(2008)A critical literature review of focused electron beam induced deposition J. Appl. Phys. 104 081301-undefined
[4]  
Kruit P(2008)Gas-assisted focused electron beam and ion beam processing and fabrication J. Vac. Sri Technol. B 26 1197-undefined
[5]  
Randolph SJ(2012)Focused electron beam induced deposition: a perspective Beilstein J. Nanotechnol. 3 597-undefined
[6]  
Fowlkes JD(2013)Synthesis of individually tuned nanomagnets for nanomagnet logic by direct write focused electron beam induced deposition ACS Nano 7 777-undefined
[7]  
Rack PD(2013)Electrically conducting, ultra-sharp, high aspect-ratio probes for AFM fabricated by electron-beam-induced deposition of platinum Ultramicroscopy 133 62-undefined
[8]  
Van Dorp WF(2004)Characteristics of nano electron source fabricated using beam assisted process J. Vac. Sri Technol. B 22 1266-undefined
[9]  
Hagen CW(2015)Nano electron source fabricated by beam-induced deposition and its unique feature Microelectron. Eng. 132 74-undefined
[10]  
Utke I(2007)Focused electron beam induced deposition of Si-based materials from SiO Chem. Vap. Deposition 13 176-undefined