Study of the Soft and Hard X-Ray Emitted by APF Plasma Focus Device in Different Pressures

被引：0
|
作者：
G. R. Etaati
R. Amrollahi
M. Habibi
Kh. Mohammadi
R. Baghdadi
A. Roomi
机构：
[1] Amir Kabir University of Technology,Department of Nuclear Engineering and Physics
[2] University of Putra,Department of Science
来源：
Journal of Fusion Energy | 2010年 / 29卷
关键词：
Plasma focus; X-ray angular distribution; Thermoluminiscent dosimeters; Photo PIN diode;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
In this paper, an investigation on the X-rays emitted in different pressures by APF plasma focus devices using filtered PIN-diodes and fast plastic scintillation detector is reported. The highest X-ray emission was observed in the pressure of 1.6 torr and the behavior of X-ray intensities registered by different filters versus applied pressure were seemed to be similar. The X-ray angular distribution was bimodal, peaked approximately at ±18°. The intensity of X-rays decreased abruptly along the central axis of the device where the cylindrical plasma pinch was formed.
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页码：503 / 507
页数：4
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