Photosensitivity of thin-film structures based on laser-deposited CuIn(TexSe1−x)2 layers

被引：0

作者：

I. V. Bodnar’

V. F. Gremenok

V. Yu. Rud’

Yu. V. Rud’

机构：

[1] State University of Informatics and Radioelectronics,A. F. Ioffe Physicotechnical Institute

[2] St. Petersburg State Technical University,undefined

[3] Russian Academy of Sciences,undefined

来源：

Semiconductors | 1998年 / 32卷

关键词：

Indium; Thin Film; Solid Solution; Magnetic Material; Chalcopyrite;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Thin films of the solid solutions CuIn(TexSe1−x)2 (0<x<1) exhibiting chalcopyrite structure were obtained by the method of laser deposition. Using half-transmitting indium layers, Schottky diodes were prepared on the basis of the films obtained. The spectral dependence of the sensitivity as a function of the ratio between Te and Se was investigated by illuminating the structures through the In contact. Analysis of the experimental results showed that the region of spectral sensitivity of such thin-film structures depends on the tellurium content in the CuIn(TexSe1−x)2 layers.

引用

页码：409 / 411

页数：2

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