Fabrication of polycrystalline La2NiMnO6 thin films on Si (1 0 0) substrates by chemical solution deposition

Polycrystalline double perovskite La2NiMnO6 thin films are successfully deposited on Si (1 0 0) substrates via chemical solution deposition. The X-ray diffraction and Raman scattering spectroscopy are used to characterize all the films, it is found that all films are single phase and polycrystalline. The field-emission scanning electron microscopy shows that the films are relatively smooth and dense. The magnetic measurements indicate that one sample exhibits a Curie temperature of about 271 K, which is close to that of the bulk material. Moreover, the low-temperature magnetization of the films is lower than that of the films deposited on LaAlO3 (1 0 0) substrates, which can be attributed to the large mismatch between the films and the Si substrates.