Extended x-ray absorption fine structure study of incorporation of Bi and Pb atoms into the crystal structure of Ba4.5Nd9Ti18O54

被引：12

作者：

Valant, M

Arcon, I

Suvorov, D

Kodre, A

Negas, T

Frahm, R

机构：

[1] TRANSTECH INC,ADAMSTOWN,MD 21702

[2] DESY,HAMBURGER SYNCHROTRONSTRAHLUNGSLAB HASYLAB,D-2000 HAMBURG,GERMANY

来源：

JOURNAL OF MATERIALS RESEARCH | 1997年 / 12卷 / 03期

关键词：

D O I：

10.1557/JMR.1997.0116

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In the extended x-ray absorption fine structure (EXAFS) study of the local environment of Bi3+ and Pb2+ ions incorporated in Ba4.5Nd9Ti18O54, actual sites of Bi- and Pb-incorporation are determined. Evidence is given that dopant ions are not distributed randomly on all theoretically possible sites; Bi3+ selectively enters one out of three possible channels, corresponding to the sites x = 0.9484, y = 0.2500, z = 0.2939, and/or x = 0.0455, y = 0.2500, z = 0.6928 previously occupied by Nd3+, while Pb2+ selectively enters site x = 0.4940, y = 0.2500, and z = 0.4993 previously shared by Ba2+ and Nd3+.

引用

页码：799 / 804

页数：6

共 12 条

[1]

Freer R., 1995, CERAM T, V53, P215

[2]

KOLAR D, 1995, EUR J SOL STATE INOR, V32, P751

[3] HIGH-STABILITY, LOW-LOSS DIELECTRICS IN THE SYSTEM BAO-ND2O3-TIO2-BI2O3 [J].