Experimental and Simulation Study of Dual Injection-Locked OEOs

被引：20

作者：

Okusaga, Olukayode ^{[1
]}

Zhou, Weimin ^{[1
]}

Levy, Etgar ^{[2
]}

Horowitz, Moshe ^{[2
]}

Carter, Gary ^{[3
]}

Menyuk, Curtis ^{[3
]}

机构：

[1] USA, Res Lab, Adelphi, MD 20783 USA

[2] Technion Israel Inst Technol, Elect Engn, Haifa, Israel

[3] Univ Maryland, Comp Sci & Elec Eng, Baltimore, MD USA

来源：

2009 JOINT MEETING OF THE EUROPEAN FREQUENCY AND TIME FORUM AND THE IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM, VOLS 1 AND 2 | 2009年

关键词：

OPTOELECTRONIC OSCILLATOR; NOISE;

D O I：

10.1109/FREQ.2009.5168312

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We investigate the physics of bidirectional injection-locking in optoelectronic oscillators (OEO). In particular, we identify the effects of injection strength on phase noise and spurious modes for a dual injection-locked OEO. Our experimental data is then used to design a numerical model of a dual injection-locked OEO. This model will be used in the future to optimize the multi-dimensional injection-locking parameters to achieve minimal phase noise and spurious mode levels.

引用

页码：875 / +

页数：2

共 10 条

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GREEN D, 2006, INT FREQ CONTR S EXP, P852

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