Improved measurement accuracy of the quadrant detector through improvement of linearity index

被引:48
作者
Cui, Song [1 ]
Soh, Yeng Chai [1 ]
机构
[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore
关键词
position sensitive particle detectors;
D O I
10.1063/1.3326078
中图分类号
O59 [应用物理学];
学科分类号
摘要
This paper presents a set of formulae for estimating the beam position projected on a quadrant detector (QD). Our new formulae are designed through a systematic procedure to improve the measurement accuracy of the QD. It can be applied to different beam profiles. It is shown in simulations that our new formulae have achieved a much better measurement accuracy. It is also shown through experimental study that our approach is robust and able to achieve very good performance in practice.
引用
收藏
页数:3
相关论文
共 15 条
[1]  
CUI S, IEEE T ELECT D UNPUB
[2]   Simultaneous manipulation and detection of living cell membrane dynamics [J].
Goegler, Michael ;
Betz, Timo ;
Kaes, Josef Alfons .
OPTICS LETTERS, 2007, 32 (13) :1893-1895
[3]   Single mode high-contrast subwavelength grating vertical cavity surface emitting lasers [J].
Huang, Michael C. Y. ;
Zhou, Ye ;
Chang-Hasnain, Connie J. .
APPLIED PHYSICS LETTERS, 2008, 92 (17)
[4]   Instant curvature measurement for microcantilever sensors [J].
Jeon, S ;
Thundat, T .
APPLIED PHYSICS LETTERS, 2004, 85 (06) :1083-1084
[5]   Development of a diffraction-type optical triangulation sensor [J].
Liu, CH ;
Jywe, WY ;
Chen, CK .
APPLIED OPTICS, 2004, 43 (30) :5607-5613
[6]   SURFACE PROFILE MEASUREMENT WITH A DUAL-BEAM OPTICAL-SYSTEM [J].
LOU, DY ;
MARTINEZ, A ;
STANTON, D .
APPLIED OPTICS, 1984, 23 (05) :746-751
[7]   EFFECTS OF ATMOSPHERIC-TURBULENCE ON PHOTODETECTOR ARRAYS [J].
MA, J ;
SUN, HY ;
WANG, SM ;
YAN, DG .
APPLIED OPTICS, 1989, 28 (11) :2123-2126
[8]   A HIGH-RESOLUTION LATERAL DISPLACEMENT SENSING METHOD USING ACTIVE ILLUMINATION OF A COOPERATIVE TARGET AND A FOCUSED 4-QUADRANT POSITION-SENSITIVE DETECTOR [J].
MAKYNEN, AJ ;
KOSTAMOVAARA, JT ;
MYLLYLA, RA .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1995, 44 (01) :46-52
[9]   NOVEL OPTICAL APPROACH TO ATOMIC FORCE MICROSCOPY [J].
MEYER, G ;
AMER, NM .
APPLIED PHYSICS LETTERS, 1988, 53 (12) :1045-1047
[10]   A microelectromechanical-based magnetostrictive magnetometer [J].
Osiander, R ;
Ecelberger, SA ;
Givens, RB ;
Wickenden, DK ;
Murphy, JC ;
Kistenmacher, TJ .
APPLIED PHYSICS LETTERS, 1996, 69 (19) :2930-2931