Sensitivity analysis of TWT's small signal gain based on the effect of rod shape and dimensions

被引:12
作者
D'Agostino, S
Emma, F
Paoloni, C
机构
[1] Univ Rome La Sapienza, Dept Elect Engn, I-00184 Rome, Italy
[2] European Space Agcy, ESTEC, NL-2200 AG Noordwijk, Netherlands
[3] Univ Roma Tor Vergata, Dept Elect Engn, I-00133 Rome, Italy
关键词
slow wave structures; small-signal gain;
D O I
10.1109/16.848291
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An extensive study aiming at analyzing the effect of rod shapes and dimensions on the gain of helix traveling wave tubes (TWT's) is performed. The evaluation of tube small-signal gain is obtained by making use of a rigorous field analysis which takes into account the helix tape model and the dielectric inhomogeneous loading conditions. Computing time to perform the analysis is extremely low compared with the time required in the case of a full wave, three-dimensional (3-D) electromagnetic simulator. The accuracy of the simulation approach has been extensively verified in a previous paper, A novel expression for the attenuation constant has been introduced in the model to improve the quality of results. The proposed study allows a better understanding of tube behavior before fabrication highlighting the contribution of the shape, the mechanical tolerances and the epsilon(r) variation of the rods to the small-signal gain.
引用
收藏
页码:1457 / 1462
页数:6
相关论文
共 7 条
[1]  
BRANCH GM, 1955, P IRE, V43, P1018
[2]   Accurate analysis of helix slow-wave structures [J].
D'Agostino, S ;
Emma, F ;
Paoloni, C .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1998, 45 (07) :1605-1613
[3]   THEORETICAL AND EXPERIMENTAL TWT HELIX LOSS DETERMINATION [J].
GILMOUR, AS ;
GILLETTE, MR ;
CHEN, JT .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (10) :1581-1588
[4]   THE EFFECT OF CONDUCTIVITY LOSSES ON PROPAGATION THROUGH THE HELICAL SLOW-WAVE STRUCTURE OF A TRAVELING-WAVE TUBE [J].
JAIN, PK ;
BASU, BN .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1988, 35 (04) :549-558
[5]   Effect of helical slow-wave circuit variations on TWT cold-test characteristics [J].
Kory, CL ;
Dayton, JA .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1998, 45 (04) :972-976
[6]  
ONODERA T, 1999, IEEE T ELECTRON DEV, V37, P1551
[7]  
Pierce J.R., 1950, TRAVELING WAVE TUBES