Spontaneous direct bonding of thick silicon nitride

被引:22
作者
Sanchez, S
Gui, C
Elwenspoek, M
机构
[1] MESA Research Institute, University of Twente, PO Box 217
关键词
D O I
10.1088/0960-1317/7/3/007
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Wafers with 1 mu m LPCVD silicon-rich nitride layers have been successfully direct bonded to silicon-rich nitride and boron-doped silicon surfaces. A chemical-mechanical polishing treatment was necessary to reduce the surface roughness of the nitride before bonding. The measured surface energies of the room-temperature bond were comparable to values found for Si-Si hydrophilic bonding. A mechanism similar to this bonding is suggested for silicon nitride bonding.
引用
收藏
页码:111 / 113
页数:3
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